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  • PATENT LAW PODCASTS
  • Scott A. McKeown of Oblon Spivak McClelland Maier & Neustadt LLP on Patent Reexamination and Patent Reissue

12/15/2010 01:00:00 PM EST

Scott A. McKeown of Oblon Spivak McClelland Maier & Neustadt LLP on Patent Reexamination and Patent Reissue

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LexisNexis Legal Business Community Staff

On this edition, Scott A. McKeown of Oblon Spivak McClelland Maier & Neustadt LLP discusses patent reexamination and patent reissue, recent developments at the USPTO and their impact on litigation strategy. He also looks at cases before the Federal Circuit and Supreme Court that may impact the patent reexamination/patent reissue landscape in 2011. Copyright© 2010 LexisNexis, a division of Reed Elsevier Inc. All rights reserved. Visit www.lexisnexis.com/community.


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